Menu
0
    0

    Your Cart is Empty

           
    Web Store / Products / LTESPAW-V2
    LTESPAW-V2 - Systems for Research

    LTESPAW-V2

    LTESPAW-V2

    Price On Request - CONTACT US FOR QUOTE
    48N/m, 190kHz, 4-Sided Tip, Al Reflex Coating, Wafer

    • A wafer of High quality long-lever etched silicon probes for TappingMode™ and other non-contact modes. 

      Unmounted for use on standard AFM's

      Bruker AFM Probes has introduced an improved version of its popular, LTESP/LTESPA AFM probes. Bruker’s new line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air.

      The new design provides:

      • Tighter dimensional specifications for improved probe to probe consistency
      • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
      • Improved probe quality and aesthetics

      This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPW-V2


    • Tip Geometry: Standard (Steep)
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5
      Back Angle: 15 ± 2.5
      Side Angle: 22.5 ± 2.5
      Tip Radius (Nom): 8
      Tip Radius (Max): 12
      Tip Set Back (Nom): 15
      Tip Set Back( RNG): 5 - 25
    • Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.

      Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 6.8
      Cantilever Thickness (RNG): 5.8 - 7.8
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1
      Back Side Coating: Reflective Aluminum