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Learn how Thermo Fisher Scientific's full line of electron microscopes (SEM, TEM, FIB) can help you visualize your materials!
Weighing Molecules with Light
Mass photometry is a revolutionary new way to analyze molecules, enabling accurate mass measurement of single molecules in solution, in their native state and without the need for labels.
Systems for Research (SFR) has been collaborating with universities, industry, and health science institutions for over 30 years, to offer an array of cutting-edge scientific instrumentation and provide greater visibility into the molecular world.
SFR has an expansive in-house service team situated across Canada to provide our clients with uninterrupted and on-going local support for their research needs.
Our mission is to empower researchers and industry professionals in surface material research by offering state-of-the-art microscopy instruments and ongoing local support for all of their research needs.
We aim to revolutionize surface material research through microscopy technologies combined with exceptional service setting new standards for accuracy, innovation, and breakthrough discoveries.
Scanning Electron Microscopes (SEM)
Desktop SEM
Transmission Electron Microscopes (TEM)
DualBeam Microscopes (FIB/SEM)
X-ray Photoelectron Spectrometer (XPS)
Atomic Force Microscopes (AFM)
3D Optical Microscopes
Nanomechanical Testing
Nanoscale Infrared Spectrometers
Stylus Profilometers
Tribometers & Mechanical Testers
Benchtop 3D X-ray Microscopes (XRM)
Micro X-ray Fluorescence (µXRF)
X-ray Absorption spectroscopy (XAS)
3D X-ray Microscopes
X-ray Optics (lab & synchrotron)
Mass Photometry (MP)
Optical photothermal Infrared Spectroscopy (O-PTIR)
Infrared+Raman Microscopy
AFM Supplies
Cryo - EM Supplies
SEM Supplies
TEM Supplies
AFM Probes
Calibration Standards
Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Ultra High Vacuum Scanning Probe Microscope (UHV SPM/STM)
Advanced imaging and diffraction for TEM
Within the semiconductor and nanotechnology research community, one of the main capabilities sought is the capacity to quickly, non-destructively, and quantitatively analyze the composition of trace level dopants and nanostructures. Modern 3D finFET transistors, which are non-planar and generally use single-digit nanometer high-K dielectric insulators in place of SiO2 gate oxides, are an example of the technological advancements in electronics and materials that have created the necessity for this kind of learning.
