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The single particle AuSome™ resolution and calibration standard with 38±4nm gold particles provide an easy way of checking resolution at high magnification. The 38nm test standards tend to have a higher density, suitable for SEM and FESEM. AuSome™ provides a continuous monolayer of gold nanoparticles with uniform particle size and inter-particles spacing over the majority of the substrate with a higher density at the edges and corner. Silicon substrate size is 5x5mm with a thickness of 0.5mm. (#16008) Unmounted or provided on an SEM specimen mount. See mount selection A-Q
AuSome™ Resolution and Calibration Standard for SEM, FIB and FESEM
Ultra high resolution standard with known size gold particles
A challenge with nanoscale microscopy is clear imaging down to the nm level. Focus, astigmatism and working distance are important factors and slight adjustments in each can make the difference in getting a publication quality image. An additional challenge is to correctly measure features at such high magnifications. To assist the discerning microscopist, Ted Pella, Inc presents the new AuSome™ combined resolution and calibration standards for nanoscale imaging. The AuSome™ resolution and calibration standards consist of known and uniform gold particles on a silicon chip. The known particle size paired with uniformity provides a real indication of the performance of the SEM, FIB or FESEM and can be used for calibration purposes well below 100nm and goes beyond the features available on other calibration standards. The AuSome™ resolution standards are available in three versions:
The gold particles are uniformly deposited on a smooth 5x5mm silicon chip with a thickness of 0.5mm (#16008), unmounted or provided on an SEM specimen mount.
See mount selection A-Q
Technical Notes, AuSome™ Resolution and Calibration Standard (49KB PDF)