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    Web Store / Products / TESP-V2
    TESP-V2 - Systems for Research

    TESP-V2

    TESP-V2

    $514.50
    37N/m, 320kHz, No Reflex Coating, 10-Pack

    • A pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's. 
      Bruker AFM Probes has introduced an improved version of its popular, TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

      The new design provides:

      • Tighter dimensional specifications for improved probe to probe consistency
      • Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
      •   Improved probe quality and aesthetics
      This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPA-V2.

    • Tip Geometry: Standard (Steep)
      Tip Height: 10 - 15
      Front Angle: 25 ± 2.5º
      Back Angle: 17.5 ± 2.5º
      Side Angle: 20 ± 2.5º
      Tip Radius (Nom): 7
      Tip Radius (Max): 10
      Tip Set Back (Nom): 13.5
      Tip Set Back( RNG): 11.5 - 15

    • Cantilever Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
      Cantilever Thickness (Nom): 3.3
      Cantilever Thickness (RNG): 2.8 - 3.8
      Cantilever Geometry: Rectangular
      Cantilevers Number: 1