by Bruker

200N/m, 525kHz, Symmetric Tip, Al Reflex coating.

Premium High-Resolution TappingMode silicon probes on improved V2 cantilever.  This probe uses a rotated tip to provide a more symmetric representation of features over 200nm. Package of 10.

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RTESP-525.

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