by Bruker

200N/m, 525kHz, Symmetric Tip, No Coatings.  Package of 10.

Premium High-Resolution TappingMode silicon probes on improved V2 cantilever.  This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RTESPA-525.

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