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Bruker
Bruker
00-10174
00-107-0091
00-107-0141
00-107-0142
00-107-1032
1550-00
1560-00
20µm tip radius, 60° cone angle
400µm radius
5µm tip radius, 60° cone angle
820-017-300
860-000-544
860-004-414
860-012-705
860-012-706
860-012-707
860-012-725
90° Wedge 1µm X 100µm
90° Wedge 1µm X 20µm
990-031-500
AD-0.5-AS
AD-0.5-SS
AD-150-NM
AD-2.8-AS
AD-2.8-P20
AD-2.8-P40
AD-2.8-SS
AD-40-AS
AD-40-P20
AD-40-SS
AD-40-P40
AE Cube Corner, 90°total included angle
AFM Sample Prep Kit
APCC-0001
APCS-0001
APCS-0099
APMC-0001
APSH-0010
APSH-0020
APSH-0040
APSH-0050
Berkovich, 142.3°, 100nm tip radius
Berkovich, 142.3º total included angle
Berkovich, 142.3º total included angle, 100nm
Berkovich, 142.3º total included angle, 50 nm
Bruker Contact mode probes for AFM-IR Type B
Bruker Contact mode probes for AFM-IR Type B - Unmounted
Cantilever Holder for Hitachi HiTech (formerly Seiko)SPA300
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